Acronym
|
Description
|
| A/D |
Analog/Digital |
| AA |
Atomic Absorption |
| AC |
Alternating Current |
| ACDS |
Analyzer Control and Data System |
| ADC |
Analog/Digital Convertor |
| ADC |
Automatic Data Collection |
| AED |
Atomic Emission Detector |
| AES |
Atomic Emission Spectroscopy |
| AES |
Auger Electron Spectroscopy |
| AGC |
Automatic Gain Control |
| AL |
Allowable Level |
| AM |
Ante Meridiem |
| AMD |
Automated Multiple Development |
| AOP |
Advanced Oxidation Processes |
| AOTF |
Acousto-Optic Tunable Filter |
| AOV |
Air Operated Valve |
| API |
Atmospheric Pressure Ionization |
| ASI |
Actuator-Sensor Interface |
| AST |
Alternate-site Testing |
| ATM |
Asynchronous Transfer Mode |
| AWG |
American Wire Gauge |
| BOD |
Biological Oxygen Demand |
| BP |
Boiling Point |
| CAA |
Clean Air Act |
| CAAA |
Clean Air Act Amendments (1990) |
| CAD |
Computer Assisted Design |
| CAE |
Computer Assisted Engineering |
| CAN |
Control Area Network |
| CCD |
Charge coupled device |
| CEM(S) |
Continuous Emission Monitoring (System) |
| CERCLA |
Comprehensive Environmental Response,
Compensation and Liability Act |
| CFR |
Code of Federal Regulations |
| CI |
Chemical Ionization |
| CID |
charge injection device |
| CIM |
Computer Assisted Manufacturing |
| CLC |
Convective Liquid Chromatography |
| CLSM |
Confocal Laser Scan Microscope |
| CMOS |
Complimentary Metal Oxide Semiconductor |
| COD |
Chemical Oxygen Demand |
| COM |
Computer |
| CRT |
Cathode Ray Tube |
| CSAT |
Certified Specialist in Analytical Technology |
| CSE |
Control System Engineer |
| CWA |
Clean Water Act |
| CZE |
Capillary Zone Electrophoresis |
| D/A |
Digital/Analog |
| DC |
Direct Current |
| DCS |
Distributed Control System, Digital Control
System |
| DDC |
Direct Digital Control |
| DDL |
Device Definition Language, Device Description
Language |
| DIAL |
Differential Absorption Laser |
| DIC |
Differential Interference Contrast |
| DID |
Discharge Ionization Detector |
| DIRTFT |
Do It Right The First Time |
| DLS |
Dynamic Light Scattering |
| DMA |
Direct Memory Access |
| DO |
Dissolved Oxygen |
| DOAS |
Differential Optical Absorption Spectroscopy |
| DOS |
Disk Operating System |
| DRIFT |
Diffuse Reflectance Infrared Fourier
Transform Spectroscopy |
| DTD |
Direct Thermal Desorption |
| ECD |
Electron Capture Detector |
| ECNICI |
Electron Capture Negative Ion Chemical
Ionization |
| ECP |
Enhanced Capabilities Port (parallel
port) |
| EDXRF |
Energy Dispersive X-Ray Fluorescence |
| EEPROM |
Electrically Erasable Programmable Read
Only Memory |
| EI |
Electron Impact, Electron Ionization |
| EID |
Electron Ionization Detector |
| EISA |
Extended Industry Standard Architecture |
| ELCD |
Electrolytic Conductivity Detector |
| EOF |
Electroosmotic Flow |
| EPCRA |
Emergency Planning and Community Right-to-know
Act |
| EPP |
Enhanced Parallel Port (parallel port) |
| EPROM |
Erasable Programmable Read Only Memory |
| ESEM |
Environmental Scanning Electron Microscope |
| F wastes |
Hazardous wastes from nonspecific sources |
| FAB |
Fast Atom Bombardment |
| FDDI |
Fiber distributed Data Interface |
| FDMA |
Frequency Division Multiple Access |
| FET |
Field Effect Transistor |
| FFF |
Field-flow Fractionation |
| FIA |
Flow Injection Analysis |
| FID |
Flame Ionization Detector |
| FIP |
Factory Information Protocol |
| FP |
Flash Point |
| FSK |
Frequency Shift Keying |
| FSOT |
Fused Silica Open Tubular capillary column |
| FTIR |
Fourier Transform Infrared |
| FTNIR |
Fourier Transform Near Infrared |
| FTTA |
Federal Technology Transfer Act |
| GC |
Gas Chromatograph |
| GC/MS |
Gas Chromatograph/Mass Spectrometer |
| GC/MS/MS |
Gas Chromatograph/Tandem Mass Spectrometer |
| GD |
Glow Discharge |
| GF |
graphite furnace |
| GFAAS |
graphite furnace atomic absorption spectroscopy |
| GIPOF |
Graded-Index Plastic Optical Fiber |
| GLP |
Good Laboratory Practice |
| GPC |
Gel Permeation Chromatography |
| GUI |
Graphical User Interface |
| HART |
Highway Addressable Remote Terminal |
| HAZOPS |
Hazard and Operability Study |
| HETP |
Height Equivalent of a Theoretical Plate |
| HPCE |
High-Performance Capillary Electrophoresis |
| HPLC |
High-Performance Liquid Chromatography |
| HPSEC |
High Performance Size Exclusion Chromatography |
| HPTLC |
High-Performance Thin Layer Chromatography |
| HRP |
Hazard Reduction Factor |
| HSWA |
Hazardous and Solid Waste Amendments
(1984) |
| HTG |
Hydrostatic Tank Gauging |
| ICAP |
Inductively Coupled Argon Plasma |
| ICAP-MS |
Inductively Coupled Argon Plasma - Mass
Spectroscopy |
| ICAP-OES |
Inductively Coupled Argon Plasma - Optical
Emission Spectroscopy |
| ICCD |
Intensified charge coupled Device |
| ICP |
Inductively coupled plasma |
| IDR |
Intrascene Dynamic Range |
| IEF |
IsoElectric Focusing |
| IMAC |
Immobilized Metal Affinity Chromatography |
| IR |
Infrared |
| ISA |
Industry Standard Architecture |
| ISE |
Ion Selective Electrode |
| Isfet |
Ion Selective Field Effect Transistor |
| ISP |
InterOperable Systems Project |
| ITD |
Ion Trap Detector |
| ITPS |
International Practical Temperature Scale |
| JCAMP.DX |
Joint Committee on Atomic and Molecular
Physical data, Data Exchange file format |
| K wastes |
Wastes from industry specific sources |
| LAGST |
Leaking Above Ground Storage Tank |
| LALLS |
Low Angle Laser Light Scattering |
| LC |
Liquid Chromatograph |
| LCD |
Liquid Crystal Display |
| LED |
Light Emitting Diode |
| LIBS |
Laser induced Breakdown spectroscopy |
| LIDAR |
Light Detection And Ranging |
| Liesa |
Laser Induced Emission Spectral Analysis |
| LIF |
Laser Induced Flourescence |
| LIMS |
Laboratory Information Management System |
| LOD |
Limits of Detection |
| LSI |
Large Scale Integration |
| LUST |
Leaking Under Ground Storage Tank |
| Ma |
Milliamp |
| MALDI |
Matrix Assisted Laser Desorption Ionization |
| MALLS |
Multi-angle Laser Light Scattering |
| MCP |
Microchannel plate |
| MEKC |
Micellar Electrokinetic Chromatography |
| mid-IR |
mid infrared spectrum covering range
400 cm-1 to 4000 cm-1 (25 tp 2.5 m) |
| MIMS |
Membrane Introduction Mass Spectrometry |
| MOS |
Metal Oxide Semiconductor |
| MPEG |
Motion Picture Expert Group |
| MS |
Mass Spectroscopy |
| MSD |
Mass Selective Detector |
| MSDS |
Material Safety Data Sheet |
| MTBF |
Mean Time Between Failure |
| MTTR |
Mean Time To Repair |
| Mv |
Millivolt, Manipulated Variable |
| NAA |
Neutron Activation Analysis |
| NAFTA |
North American Free Trade Agreement |
| NDIR |
Non-Dispersive Infrared |
| NEC |
National Electrical Code |
| NESHAPs |
National Emission Standards for Hazardous
Air Pollutants |
| NICI |
Negative Ion Chemical Ionization |
| NIOSH |
National Institute of Science and Health |
| NIR |
Near Infrared |
| NMR |
Nuclear Magnetic Resonance |
| NMRS |
Nuclear Magnetic Resonance Spectroscopy |
| NPD |
Nitrogen-Phosphorous Detector |
| NPDES |
National Pollutant Discharge Elimination
System |
| NSOM |
Near-field Scanning Optical Microscope |
| OD |
Object Directory |
| OES |
Optical Emission Spectroscopy |
| OIML |
|
| OPA |
Oil Pollution Act (1990) |
| OPLC |
Over Pressure Layer Chromatography |
| OQ |
Operational Qualification |
| ORP |
Oxidation Reduction Potential |
| P wastes |
Acutely hazardous discarded commercial
products, off specification products, and spill residues |
| P&ID |
Process and Instrumentation Diagram |
| PAD |
Photodiode Array Detector, Pulsed Amerometric
Detection |
| PAI |
Process Analysis Instrumentation |
| PAS |
Photo Acoustic Spectroscopy |
| PC |
Personal Computer |
| PCI |
Peripheral Component Interconnect |
| PCMIA |
Personal Computer Memory Card International
Association |
| PCS |
Photn Correlation Spectroscopy |
| PEL |
Potential Exposure Limits |
| PFD |
Probability of Failure on Demand, Process
Flow Diagram |
| PID |
Photo Ionization Detector, Proportional-plus-Integral-
plus-Derivative |
| PLC |
Programmable Logic Controller |
| PLIF |
Pointer Laser Induced Fluorescence |
| PLS |
Partial Least Squares |
| PM |
Preventative Maintenance, Post Meridiem |
| POIS |
Plant Operating Information System |
| POTW |
Publicly Owned Treatment Works |
| PPP |
Point-to-Point Protocol |
| PROFIBUS |
Process Fieldbus |
| PSD |
Particle Size Distribution |
| PTGC |
Programmed Temperature Gas Chromatograph |
| PV |
Process Variable, Principle Variable |
| QA |
Quality Assurance |
| RAID |
Redundant Array of Inexpensive Disks |
| RBS |
Rutherford Backscattering Spectroscopy |
| RCRA |
Resource Conservation and Recovery Act |
| RFDC |
Radio Frequency Data Communications |
| RI |
Refractive Index |
| RISC |
Reduced Instruction Set Chip |
| RTU |
Remote Terminal Unit |
| SALLS |
Single Angle Laser Light Scattering |
| SARA |
Superfund Amendments and Reauthorization
Act (1986) |
| SAW |
Standing Acoustic Wave |
| SCADA |
Supervisory Control & Data Acquisition |
| SCAM |
SCSI Configured AutoMatically |
| SCE |
Suppressed Capillary Electrophoresis |
| SCR |
Selective Catalytic Reduction, Silicon
Controlled Rectifier |
| SCSI |
Small Computer Standard Interface |
| SD |
Standard Deviation |
| SDF |
Structure Data File (.SDF) file format
for physical & Toxicological properties |
| SdFFF |
Sedimentation Field-flow Fractionation |
| SEC |
Size-Exclusion Chromatography |
| SECS |
Semiconductor Equipment Communications
Standard |
| SECSII |
Semiconductor Equipment Communications
Standard Layer 2 |
| SEM |
Scanning Electron Microscope |
| SFC |
Supercritical Fluid Chromatography |
| SHS |
Sample Handling System |
| SIMDIS |
Simulated Distillation |
| SIMS |
Symposium for Innovation in Measurement
Sciences |
| SIPOF |
Step-index Plastic Optical Fiber |
| SISCH |
Step Index Separate Confinement Heterostructure |
| SIT |
Silicon Intensified Target |
| SITE |
Superfund Information Technology Exchange |
| SLIP |
Serial Line Interface Protocol |
| SP |
Set Point |
| SP(76) |
Standards and Practices (Group of ISA) |
| SPC |
Statistical Process Control |
| SPCC |
Spill Prevention, Control, and Countermeasures
Program |
| SPME |
Solid Phase Microextraction |
| SPR |
Surface Plasmon Resonance |
| SQC |
Statistical Quality Control |
| SRM |
Standard Reference Materials |
| SWLI |
Scanning White Light Interferometry |
| TA-MS |
Thermal Analysis-Mass Spectrometry |
| TC |
Thermal Conductivity, Temperature Compensator |
| TCA |
Total Carbon Analyzer |
| TCD |
Thermal Conductivity Detector |
| TCLP |
Toxicity Characteristics Leaching Procedure |
| TDD |
Time Division Duplex |
| TDLAS |
Tunable Diode Laser Absorption Spectrophotometer |
| TDMA |
Time Division Multiple Access |
| TILS |
Total Intensity Light Scattering |
| TLC |
Thin Layer Chromatography |
| TLM |
Threshold Limit Value |
| TMR |
Triple Modular Redundancy |
| TOC |
Total Organic Carbon |
| TQM |
Total Quality Management |
| TRI |
Toxic Release Inventory |
| TSCA |
Toxic Substances Control Act |
| TSDF |
Treatment, Storage, or Disposal Facility |
| TWA |
Time Weighted Average |
| TXRF |
Total Reflection X-ray Flourescence |
| U wastes |
Other discarded commercial products,
off specification products, and spill residues |
| UNEP |
United Nations Environment Programme |
| UST |
Underground Storage Tank |
| UV |
UltraViolet |
| UVLA |
Ultraviolet Laser Ablation |
| VDS |
Virtual Device Syntax |
| VFD |
Virtual Field Device |
| VHAP |
Volatile Hazardous Air Pollutant |
| VIS |
Visible |
| VISIT |
Vendor's Information System for Innovative
Treatment Technologies |
| VL |
Video Electronics Standards Association |
| VLSI |
Very Large Scale Integration |
| VOC |
Volatile Organic Compound |
| VPD-AAS |
Vapor Phase Deposition combined with
Atomic Absorption Spectroscopy |
| VPD-ICPMS |
Vapor Phase Deposition combined with
Inductively Coupled Plasma Mass Spectrometry |
| WYSIWYG |
What You See Is What You Get |
| XFMR |
Transformer |
| XRF |
X-Ray Fluorescence |
| XRMA |
X-Ray Microanalysis |
